Results of the cold testing for identical JFETs

Set A










#

1

2

3

4

1

2

3

4

4

Condition

w

w

w

w

c

c

c

c

c-t

mA/div

1

1

1

1

0.2

0.2

0.2

0.2

0.2

Line 1

1.9

1.8

1.9

1.8

0.16

0.13

0.06

0.1

0.38

Line 2

2.5

2.4

2.6

2.5

0.75

0.33

0.25

0.33

0.5

Line 3

3.1

3

3.1

3.2

1.2

0.66

0.58

0.69

0.65

Line 4

3.8

3.7

3.8

3.8

1.81

1.18

1.05

1.18

0.8

Line 5

4.6

4.5

4.6

4.7

-

1.8

1.63

1.79

0.97


Set B










#

1

2

3

4

1

2

3

4

4

Condition

w

w

w

w

c

c

c

c

c-t

mA/div

1

1

1

1

1

1

1

1

1

Line 1

5.2

5.2

5.4

5.4

3.1

3

3.2

3.1

4

Line 2

6.05

6.1

6.2

6.3

4.05

3.9

4.1

4

5.1

Line 3

6.9

7.05

7.1

7.3

5.15

5

5.1

5.05

6.2

Line 4

7.85

8

8

8.3

6.3

6.1

6.3

6.2

7.5

Line 5

8.8

9

9

9.4

7.55

7.3

7.5

7.5

8.6?




FET #4 of Set B for the final cold torture trial had a nearly invisable fifth line. I could see the point at the end of the line, so I extrapolated backwards and made an assumption that this value of 8.6mA was appropriate.


These are all p-channel JFETs (J270/SST270). w=warm, c=cold, c-t= cold “tortured”. All values for the lines are in mA. All JFETs were matched previously warm, so these sets were pre-determined.


Comparing warm and cold, Set B, which was considered less well matched than Set A under warm testing, appears to be the better of the two sets hot and cold, looking at the range at which these values change. Set A is stil very good, however. There seems to be some discrepency in the values, as Set B appears to always be in the 1 mA range whilie Set A cold is in the 0.1 mA range. I will analyse this further. It also appears that the mA values could be negative as opposed to postitive going by Output Characteristics diagram 3 on page 8-3 of the Vishay J270/J271 data sheet. This is a minor thing, as I can simply denote the values as negative instead.